smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.0-8-amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 4TB Serial Number: S6BCNG0R400507M LU WWN Device Id: 5 002538 f71402737 Firmware Version: SVT01B6Q User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 3 21:46:55 2021 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 320) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 099 099 010 Pre-fail Always - 10 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 2840 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 4 177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 3 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 10 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 099 099 010 Pre-fail Always - 10 187 Uncorrectable_Error_Cnt 0x0032 099 099 000 Old_age Always - 5 190 Airflow_Temperature_Cel 0x0032 075 061 000 Old_age Always - 25 195 ECC_Error_Rate 0x001a 199 199 000 Old_age Always - 5 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 100 100 000 Old_age Always - 0 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 21796078605 SMART Error Log Version: 1 ATA Error Count: 5 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 5 occurred at disk power-on lifetime: 1400 hours (58 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 b0 00 a2 f0 40 Error: UNC at LBA = 0x00f0a200 = 15770112 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 b0 00 a2 f0 40 16 8d+15:21:11.919 READ FPDMA QUEUED 60 00 a8 00 a0 f0 40 15 8d+15:21:11.919 READ FPDMA QUEUED 60 00 a0 00 9c f0 40 14 8d+15:21:11.919 READ FPDMA QUEUED 60 00 98 00 98 f0 40 13 8d+15:21:11.919 READ FPDMA QUEUED 60 00 90 00 94 f0 40 12 8d+15:21:11.919 READ FPDMA QUEUED Error 4 occurred at disk power-on lifetime: 1399 hours (58 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 b0 80 9e 3c 40 Error: UNC at LBA = 0x003c9e80 = 3972736 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 80 b0 80 9e 3c 40 16 8d+14:39:48.207 READ FPDMA QUEUED 60 80 a8 00 95 3c 40 15 8d+14:39:48.207 READ FPDMA QUEUED 60 80 a0 80 8d 3c 40 14 8d+14:39:48.207 READ FPDMA QUEUED 60 00 98 80 85 3c 40 13 8d+14:39:48.207 READ FPDMA QUEUED 60 80 90 00 7d 3c 40 12 8d+14:39:48.207 READ FPDMA QUEUED Error 3 occurred at disk power-on lifetime: 1399 hours (58 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 98 80 9d cf 40 Error: UNC at LBA = 0x00cf9d80 = 13606272 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 98 80 9d cf 40 13 8d+14:34:42.434 READ FPDMA QUEUED 60 00 90 00 37 cf 40 12 8d+14:34:42.434 READ FPDMA QUEUED 60 00 88 00 3f cf 40 11 8d+14:34:42.434 READ FPDMA QUEUED 60 80 78 00 46 cf 40 0f 8d+14:34:42.434 READ FPDMA QUEUED 60 80 70 80 4d cf 40 0e 8d+14:34:42.434 READ FPDMA QUEUED Error 2 occurred at disk power-on lifetime: 1399 hours (58 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 80 9d cf 40 Error: UNC at LBA = 0x00cf9d80 = 13606272 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 00 80 9d cf 40 00 8d+14:34:42.226 READ FPDMA QUEUED 60 00 f0 80 a5 cf 40 1e 8d+14:34:42.226 READ FPDMA QUEUED 47 00 01 30 06 00 40 14 8d+14:34:42.226 READ LOG DMA EXT 47 00 01 30 00 00 40 14 8d+14:34:42.226 READ LOG DMA EXT 47 00 01 00 00 00 40 14 8d+14:34:42.226 READ LOG DMA EXT Error 1 occurred at disk power-on lifetime: 1399 hours (58 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 a0 80 a5 cf 40 Error: UNC at LBA = 0x00cfa580 = 13608320 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 a0 80 a5 cf 40 14 8d+14:34:41.898 READ FPDMA QUEUED 60 00 98 80 9d cf 40 13 8d+14:34:41.898 READ FPDMA QUEUED 60 80 90 00 94 cf 40 12 8d+14:34:41.898 READ FPDMA QUEUED 60 00 88 00 8d cf 40 11 8d+14:34:41.898 READ FPDMA QUEUED 60 00 80 00 87 cf 40 10 8d+14:34:41.898 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.0-8-amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 4TB Serial Number: S6BCNG0R400505E LU WWN Device Id: 5 002538 f71402735 Firmware Version: SVT01B6Q User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 3 21:46:56 2021 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 320) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 2840 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 4 177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 3 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0032 069 061 000 Old_age Always - 31 195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 100 100 000 Old_age Always - 0 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 21797946454 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.0-8-amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 4TB Serial Number: S6BCNG0R208257E LU WWN Device Id: 5 002538 f712079f9 Firmware Version: SVT01B6Q User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 3 21:46:56 2021 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 320) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 099 099 010 Pre-fail Always - 23 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 2840 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 4 177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 3 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 23 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 099 099 010 Pre-fail Always - 23 187 Uncorrectable_Error_Cnt 0x0032 099 099 000 Old_age Always - 111 190 Airflow_Temperature_Cel 0x0032 069 061 000 Old_age Always - 31 195 ECC_Error_Rate 0x001a 199 199 000 Old_age Always - 111 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 100 100 000 Old_age Always - 0 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 21778154577 SMART Error Log Version: 1 ATA Error Count: 111 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 111 occurred at disk power-on lifetime: 2833 hours (118 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 80 e0 1f 5d 40 Error: UNC at LBA = 0x005d1fe0 = 6103008 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 20 80 e0 1f 5d 40 10 2d+13:42:46.695 READ FPDMA QUEUED 60 60 78 a0 22 5d 40 0f 2d+13:42:46.695 READ FPDMA QUEUED 60 e0 70 00 24 5d 40 0e 2d+13:42:46.695 READ FPDMA QUEUED 61 08 68 10 18 00 40 0d 2d+13:42:46.695 WRITE FPDMA QUEUED 47 00 01 30 06 00 40 08 2d+13:42:46.695 READ LOG DMA EXT Error 110 occurred at disk power-on lifetime: 2833 hours (118 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 40 a0 22 5d 40 Error: UNC at LBA = 0x005d22a0 = 6103712 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 60 40 a0 22 5d 40 08 2d+13:42:46.233 READ FPDMA QUEUED 60 20 38 e0 1f 5d 40 07 2d+13:42:46.233 READ FPDMA QUEUED 60 a0 30 00 18 5d 40 06 2d+13:42:46.233 READ FPDMA QUEUED 60 e0 20 00 0c 5d 40 04 2d+13:42:46.233 READ FPDMA QUEUED 60 20 f0 e0 17 5d 40 1e 2d+13:42:46.233 READ FPDMA QUEUED Error 109 occurred at disk power-on lifetime: 2833 hours (118 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 c8 d8 0f 5d 40 Error: UNC at LBA = 0x005d0fd8 = 6098904 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 c8 d8 0f 5d 40 19 2d+13:42:45.806 READ FPDMA QUEUED 60 08 c0 d0 0f 5d 40 18 2d+13:42:45.806 READ FPDMA QUEUED 60 08 b8 c8 0f 5d 40 17 2d+13:42:45.806 READ FPDMA QUEUED 60 08 b0 c0 0f 5d 40 16 2d+13:42:45.806 READ FPDMA QUEUED 60 08 a8 b8 0f 5d 40 15 2d+13:42:45.806 READ FPDMA QUEUED Error 108 occurred at disk power-on lifetime: 2833 hours (118 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 88 a0 0f 5d 40 Error: UNC at LBA = 0x005d0fa0 = 6098848 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 88 a0 0f 5d 40 11 2d+13:42:45.580 READ FPDMA QUEUED 60 08 80 98 0f 5d 40 10 2d+13:42:45.580 READ FPDMA QUEUED 60 08 78 90 0f 5d 40 0f 2d+13:42:45.580 READ FPDMA QUEUED 60 08 70 88 0f 5d 40 0e 2d+13:42:45.580 READ FPDMA QUEUED 60 08 68 80 0f 5d 40 0d 2d+13:42:45.580 READ FPDMA QUEUED Error 107 occurred at disk power-on lifetime: 2833 hours (118 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 f8 58 0f 5d 40 Error: UNC at LBA = 0x005d0f58 = 6098776 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 f8 58 0f 5d 40 1f 2d+13:42:45.303 READ FPDMA QUEUED 60 08 b8 50 0f 5d 40 17 2d+13:42:45.303 READ FPDMA QUEUED 60 08 b0 48 0f 5d 40 16 2d+13:42:45.303 READ FPDMA QUEUED 60 08 a8 40 0f 5d 40 15 2d+13:42:45.303 READ FPDMA QUEUED 60 08 a0 38 0f 5d 40 14 2d+13:42:45.303 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.0-8-amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 4TB Serial Number: S6BCNG0R210019N LU WWN Device Id: 5 002538 f712080db Firmware Version: SVT01B6Q User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 3 21:46:56 2021 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 320) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 099 099 010 Pre-fail Always - 2 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 2840 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 4 177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 3 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 2 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 099 099 010 Pre-fail Always - 2 187 Uncorrectable_Error_Cnt 0x0032 099 099 000 Old_age Always - 3 190 Airflow_Temperature_Cel 0x0032 070 061 000 Old_age Always - 30 195 ECC_Error_Rate 0x001a 199 199 000 Old_age Always - 3 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 100 100 000 Old_age Always - 0 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 21779945334 SMART Error Log Version: 1 ATA Error Count: 3 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 3 occurred at disk power-on lifetime: 2832 hours (118 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 a8 50 89 9f 40 Error: UNC at LBA = 0x009f8950 = 10455376 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 a8 50 89 9f 40 15 2d+13:03:27.645 READ FPDMA QUEUED 60 08 a0 48 89 9f 40 14 2d+13:03:27.645 READ FPDMA QUEUED 60 08 98 40 89 9f 40 13 2d+13:03:27.645 READ FPDMA QUEUED 61 01 08 08 18 00 40 01 2d+13:03:27.645 WRITE FPDMA QUEUED 61 08 f8 10 18 00 40 1f 2d+13:03:27.645 WRITE FPDMA QUEUED Error 2 occurred at disk power-on lifetime: 2832 hours (118 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 78 40 89 9f 40 Error: UNC at LBA = 0x009f8940 = 10455360 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 c0 78 40 89 9f 40 0f 2d+13:03:27.319 READ FPDMA QUEUED 60 80 70 00 84 9f 40 0e 2d+13:03:27.319 READ FPDMA QUEUED 60 c0 68 40 81 9f 40 0d 2d+13:03:27.319 READ FPDMA QUEUED 60 80 b8 00 7c 9f 40 17 2d+13:03:27.319 READ FPDMA QUEUED 61 08 a0 40 25 df 40 14 2d+13:03:27.319 WRITE FPDMA QUEUED Error 1 occurred at disk power-on lifetime: 2832 hours (118 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 50 40 71 9f 40 Error: UNC at LBA = 0x009f7140 = 10449216 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 c0 50 40 71 9f 40 0a 2d+13:03:26.955 READ FPDMA QUEUED 60 80 48 00 6c 9f 40 09 2d+13:03:26.955 READ FPDMA QUEUED 60 c0 40 40 69 9f 40 08 2d+13:03:26.955 READ FPDMA QUEUED 60 80 38 00 64 9f 40 07 2d+13:03:26.955 READ FPDMA QUEUED 60 c0 a0 40 61 9f 40 14 2d+13:03:26.955 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.0-8-amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 4TB Serial Number: S6BCNG0R200244K LU WWN Device Id: 5 002538 f71203bac Firmware Version: SVT01B6Q User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 3 21:46:56 2021 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 320) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 099 099 010 Pre-fail Always - 3 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 3737 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 6 177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 6 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 099 099 010 Pre-fail Always - 3 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 099 099 010 Pre-fail Always - 3 187 Uncorrectable_Error_Cnt 0x0032 099 099 000 Old_age Always - 6 190 Airflow_Temperature_Cel 0x0032 070 060 000 Old_age Always - 30 195 ECC_Error_Rate 0x001a 199 199 000 Old_age Always - 6 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 1 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 36957632622 SMART Error Log Version: 1 ATA Error Count: 6 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 6 occurred at disk power-on lifetime: 3730 hours (155 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 70 d0 a0 87 40 Error: UNC at LBA = 0x0087a0d0 = 8888528 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 70 d0 a0 87 40 0e 2d+14:12:48.094 READ FPDMA QUEUED 60 08 68 c8 a0 87 40 0d 2d+14:12:48.094 READ FPDMA QUEUED 60 08 60 c0 a0 87 40 0c 2d+14:12:48.094 READ FPDMA QUEUED 60 08 58 b8 a0 87 40 0b 2d+14:12:48.094 READ FPDMA QUEUED 60 08 50 b0 a0 87 40 0a 2d+14:12:48.094 READ FPDMA QUEUED Error 5 occurred at disk power-on lifetime: 3730 hours (155 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 90 50 a0 87 40 Error: UNC at LBA = 0x0087a050 = 8888400 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 90 50 a0 87 40 12 2d+14:12:47.782 READ FPDMA QUEUED 60 08 88 48 a0 87 40 11 2d+14:12:47.782 READ FPDMA QUEUED 60 08 78 40 a0 87 40 0f 2d+14:12:47.782 READ FPDMA QUEUED 60 08 70 38 a0 87 40 0e 2d+14:12:47.782 READ FPDMA QUEUED 60 08 68 30 a0 87 40 0d 2d+14:12:47.782 READ FPDMA QUEUED Error 4 occurred at disk power-on lifetime: 3730 hours (155 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 b8 00 a8 87 40 Error: UNC at LBA = 0x0087a800 = 8890368 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 e0 b8 00 a8 87 40 17 2d+14:12:47.239 READ FPDMA QUEUED 60 e0 b0 00 a0 87 40 16 2d+14:12:47.239 READ FPDMA QUEUED 60 08 f8 d8 93 87 40 1f 2d+14:12:47.239 READ FPDMA QUEUED 60 08 d8 d0 93 87 40 1b 2d+14:12:47.239 READ FPDMA QUEUED 61 08 d0 d0 93 87 40 1a 2d+14:12:47.239 WRITE FPDMA QUEUED Error 3 occurred at disk power-on lifetime: 3730 hours (155 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 c8 d0 93 87 40 Error: UNC at LBA = 0x008793d0 = 8885200 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 c8 d0 93 87 40 19 2d+14:12:46.843 READ FPDMA QUEUED 60 08 c0 c8 93 87 40 18 2d+14:12:46.843 READ FPDMA QUEUED 60 08 b8 c0 93 87 40 17 2d+14:12:46.843 READ FPDMA QUEUED 60 08 b0 b8 93 87 40 16 2d+14:12:46.843 READ FPDMA QUEUED 60 08 a8 b0 93 87 40 15 2d+14:12:46.843 READ FPDMA QUEUED Error 2 occurred at disk power-on lifetime: 3730 hours (155 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 38 50 93 87 40 Error: UNC at LBA = 0x00879350 = 8885072 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 08 38 50 93 87 40 07 2d+14:12:46.411 READ FPDMA QUEUED 60 08 30 48 93 87 40 06 2d+14:12:46.411 READ FPDMA QUEUED 60 08 28 40 93 87 40 05 2d+14:12:46.411 READ FPDMA QUEUED 60 08 20 38 93 87 40 04 2d+14:12:46.411 READ FPDMA QUEUED 60 08 18 30 93 87 40 03 2d+14:12:46.411 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.0-8-amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 4TB Serial Number: S6BCNG0R208280N LU WWN Device Id: 5 002538 f71207a10 Firmware Version: SVT01B6Q User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 3 21:46:56 2021 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 320) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 2840 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 4 177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 3 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0032 069 060 000 Old_age Always - 31 195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 100 100 000 Old_age Always - 0 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 21772808230 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.